Blog

Featured Post

Comparing the Different Methods of Residual Stress Mapping

Read More

Recent Posts

Comparing the Different Methods of Residual Stress Mapping

| | Blog, Residual StressArea mapping offers a visual look at how residual stress is affecting a component. This article compares the four most common area mapping methods.Read More
A graph titled 'Reference sample by Yamamoto science tool.' On the left side of the chart are the numbers 0-80, representing a Rockwell Hardness rating. On the bottom of the chart are the numbers 0-12, which reference X-ray FWHM degrees. The chart showcases the correlation between surface hardness and FWHM: As FWHM increases, so does surface hardness.

Measuring Case Depth Hardness

| | Blog, Case Depth Hardness Testing, FWHMThis blog explores traditional and newer methods of measuring case depth hardness, ranging from Brinell and Rockwell to XRD.Read More
The m-Laue with a slide stage integration

Exploring the m-Laue Single Crystal Orientation System’s Integration Capabilities

| | Blog, Laue MethodPulstec’s m-Laue crystal orientation system is designed for in-line manufacturing quality control applications. Learn more about its integration capabilities.Read More
ICSP-15

Exhibit at ICSP-15

| | Events/NewsExhibit at ICSP-15 Date: September 22-25 2025 Place: Purdue University, West Lafayette, IN Subjects: 15th International Conference on Shot Peening Details: Pulstec exhibits at...Read More
s-Laue versus m-Laue

Single Crystal Orientation System Comparison: s-Laue Versus m-Laue

| | Blog, Laue MethodPulstec offers two single crystal orientation systems: the s-Laue and m-Laue. Learn more about the differences between these two products.Read More
Pulstec products in quality assurance processes

How Pulstec’s Devices Are Used in Quality Assurance Processes

| | BlogPulstec's industry-leading electronics equipment is widely used in quality assurance processes around the world. Learn more in this article.Read More